David Charles Joy

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Knoxville, TN, US

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Patents Grantslast 30 patents

Information Patent Grant
Quantitative secondary electron detection
- Patent number 10,256,071
- Issue date Apr 9, 2019
- Science Tomorrow LLC
- Jyoti Agrawal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitative secondary electron detection
- Patent number 9,966,224
- Issue date May 8, 2018
- Jyoti Agrawal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterning methods and systems using reflected interference patterns
- Patent number 6,967,067
- Issue date Nov 22, 2005
- University of Tennessee Research Foundation
- Daniel J. C. Herr
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Patterning methods and systems using reflected interference patterns
- Patent number 6,730,443
- Issue date May 4, 2004
- University of Tennessee Research Foundation
- Daniel J. C. Herr
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
QUANTITATIVE SECONDARY ELECTRON DETECTION
- Publication number 20170309445
- Publication date Oct 26, 2017
- ScienceTomorrow
- Jyoti Agrawal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
QUANTITATIVE SECONDARY ELECTRON DETECTION
- Publication number 20160148780
- Publication date May 26, 2016
- Jyoti Agrawal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Patterning methods and systems using reflected interference patterns
- Publication number 20040170928
- Publication date Sep 2, 2004
- Daniel J.C. Herr
- B82 - NANO-TECHNOLOGY
Information Patent Application
Patterning methods and systems using reflected interference patterns
- Publication number 20010041296
- Publication date Nov 15, 2001
- Daniel J.C. Herr
- B82 - NANO-TECHNOLOGY