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David Charles Reynolds
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Martinez, CA, US
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last 30 patents
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Patent Application
METHOD AND APPARATUS FOR X-RAY MICROSCOPY
Publication number
20170261442
Publication date
Sep 14, 2017
Sigray, Inc.
Wenbing Yun
G01 - MEASURING TESTING
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Patent Application
DIVERGING X-RAY SOURCES USING LINEAR ACCUMULATION
Publication number
20160351370
Publication date
Dec 1, 2016
Sigray, Inc.
Wenbing Yun
H01 - BASIC ELECTRIC ELEMENTS