David Chen

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for adaptively scanning a sample during electron...
- Patent number 9,734,987
- Issue date Aug 15, 2017
- KLA-Tencor Corporation
- Gary Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for adaptively scanning a sample during electron...
- Patent number 9,257,260
- Issue date Feb 9, 2016
- KLA-Tencor Corporation
- Gary Fan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and System for Adaptively Scanning a Sample During Electron...
- Publication number 20160155605
- Publication date Jun 2, 2016
- KLA-Tencor Corporation
- Gary Fan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Adaptively Scanning a Sample During Electron...
- Publication number 20140319342
- Publication date Oct 30, 2014
- KLA-Tencor Corporation
- Gary Fan
- G01 - MEASURING TESTING