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David Crompton
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Lowell, MA, US
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last 30 patents
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Patent Grant
Material property determination using photothermal speckle detection
Patent number
10,605,662
Issue date
Mar 31, 2020
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
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Patent Grant
Devices and methods for sensing targets using photothermal speckle...
Patent number
10,228,284
Issue date
Mar 12, 2019
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
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Patent Grant
Symmetric micro-optic module
Patent number
10,168,538
Issue date
Jan 1, 2019
Massachusetts Institute of Technology
Michael H. Valois
G02 - OPTICS
Patents Applications
last 30 patents
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Patent Application
Material Property Determination Using Photothermal Speckle Detection
Publication number
20190250038
Publication date
Aug 15, 2019
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING
Information
Patent Application
Symmetric Micro-Optic Module
Publication number
20180299682
Publication date
Oct 18, 2018
Michael H. Valois
G02 - OPTICS
Information
Patent Application
DEVICES AND METHODS FOR SENSING TARGETS USING PHOTOTHERMAL SPECKLE...
Publication number
20170211977
Publication date
Jul 27, 2017
Massachusetts Institute of Technology
Thomas H. Jeys
G01 - MEASURING TESTING