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David D. Sieloff
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Georgetown, TX, US
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last 30 patents
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Patent Grant
Method of measuring thin layers using SIMS
Patent number
7,579,590
Issue date
Aug 25, 2009
FREESCALE SEMICONDUCTOR, INC.
Zhi-Xiong (Jack) Jiang
G01 - MEASURING TESTING
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Patent Grant
Processes for testing a region for an analyte and a process for for...
Patent number
7,527,976
Issue date
May 5, 2009
FREESCALE SEMICONDUCTOR, INC.
Steven M. Hues
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Method of measuring thin layers using sims
Publication number
20090032704
Publication date
Feb 5, 2009
Freescale Semiconductor, Inc.
Zhi-Xiong Jiang (Jack)
G01 - MEASURING TESTING
Information
Patent Application
Processes for testing a region for an analyte and a process for for...
Publication number
20060188999
Publication date
Aug 24, 2006
Freescale Semiconductor, Inc.
Steven M. Hues
G01 - MEASURING TESTING