David Dascher

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Colorado Springs, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Characterization and correction of voltage probe, current probe and...
- Patent number 9,618,599
- Issue date Apr 11, 2017
- Keysight Technologies, Inc.
- David Dascher
- G01 - MEASURING TESTING
Information Patent Grant
Method of making multiple lead voltage probe
- Patent number 5,940,965
- Issue date Aug 24, 1999
- Hewlett-Packard Company
- Thomas F. Uhling
- G01 - MEASURING TESTING
Information Patent Grant
Multiple lead voltage probe and method of making same
- Patent number 5,898,312
- Issue date Apr 27, 1999
- Hewlett-Packard Company
- Thomas F. Uhling
- G01 - MEASURING TESTING
Information Patent Grant
Multiple lead voltage probe and method of making same
- Patent number 5,654,647
- Issue date Aug 5, 1997
- Hewlett-Packard Company
- Thomas F. Uhling
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexing electronic test probe
- Patent number 5,629,617
- Issue date May 13, 1997
- Hewlett-Packard Company
- Thomas F. Uhling
- G01 - MEASURING TESTING
Information Patent Grant
Multiple lead analog voltage probe with high signal integrity over...
- Patent number 5,625,299
- Issue date Apr 29, 1997
- Thomas F. Uhling
- G01 - MEASURING TESTING
Information Patent Grant
Voltage probe with reverse impedance matching
- Patent number 5,583,447
- Issue date Dec 10, 1996
- Hewlett-Packard Company
- David J. Dascher
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHARACTERIZATION AND CORRECTION OF VOLTAGE PROBE, CURRENT PROBE AND...
- Publication number 20130076372
- Publication date Mar 28, 2013
- AGILENT TECHNOLOGIES, INC.
- David Dascher
- G01 - MEASURING TESTING
Information Patent Application
Method and system for measuring band pass filtered phase noise of a...
- Publication number 20070271049
- Publication date Nov 22, 2007
- James A. Carole
- G01 - MEASURING TESTING