David Desmortreux

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May Sur Orne, FR

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and wafer with a test structure and method for...
- Patent number 8,395,399
- Issue date Mar 12, 2013
- NXP B.V.
- Lucie Rousseville
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND WAFER WITH A TEST STRUCTURE AND METHOD FOR...
- Publication number 20100253372
- Publication date Oct 7, 2010
- NXP B.V.
- Lucie Rousseville
- G01 - MEASURING TESTING