David E. Aspnes

Person

Apex, NC, US

People

Patents Grantslast 30 patents

Information Patent Grant
Normal incidence rotating compensator ellipsometer
- Patent number 7,355,708
- Issue date Apr 8, 2008
- KLA-Tencor Corporation
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Normal incidence rotating compensator ellipsometer
- Patent number 7,173,700
- Issue date Feb 6, 2007
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 6,831,743
- Issue date Dec 14, 2004
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 6,650,415
- Issue date Nov 18, 2003
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 6,449,043
- Issue date Sep 10, 2002
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Method of reducing noise generated by arc lamps in optical systems...
- Patent number 6,411,381
- Issue date Jun 25, 2002
- North Carolina State University
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Thin film optical measurement system and method with calibrating el...
- Patent number 6,411,385
- Issue date Jun 25, 2002
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 6,320,657
- Issue date Nov 20, 2001
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Thin film optical measurement system and method with calibrating el...
- Patent number 6,304,326
- Issue date Oct 16, 2001
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and polarimeter with zero-order plate compensator
- Patent number 6,181,421
- Issue date Jan 30, 2001
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 6,134,012
- Issue date Oct 17, 2000
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 5,973,787
- Issue date Oct 26, 1999
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Thin film optical measurement system and method with calibrating el...
- Patent number 5,900,939
- Issue date May 4, 1999
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Broadband spectroscopic rotating compensator ellipsometer
- Patent number 5,877,859
- Issue date Mar 2, 1999
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Grant
Thin film optical measurement system and method with calibrating el...
- Patent number 5,798,837
- Issue date Aug 25, 1998
- Therma-Wave, Inc.
- David E. Aspnes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Normal incidence rotating compensator ellipsometer
- Publication number 20070091311
- Publication date Apr 26, 2007
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Application
Normal incidence rotating compensator ellipsometer
- Publication number 20050248763
- Publication date Nov 10, 2005
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Application
Broadband spectroscopic rotating compensator ellipsometer
- Publication number 20040042009
- Publication date Mar 4, 2004
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Application
Broadband spectroscopic rotating compensator ellipsometer
- Publication number 20020191186
- Publication date Dec 19, 2002
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Application
Broadband spectroscopic rotating compensator ellipsometer
- Publication number 20020018205
- Publication date Feb 14, 2002
- David E. Aspnes
- G01 - MEASURING TESTING
Information Patent Application
Thin film optical measurement system and method with calibrating el...
- Publication number 20010046049
- Publication date Nov 29, 2001
- David E. Aspnes
- G01 - MEASURING TESTING

David E. Aspnes

Person

Patents Grantslast 30 patents

Normal incidence rotating compensator ellipsometer

Normal incidence rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Method of reducing noise generated by arc lamps in optical systems...

Thin film optical measurement system and method with calibrating el...

Broadband spectroscopic rotating compensator ellipsometer

Thin film optical measurement system and method with calibrating el...

Ellipsometer and polarimeter with zero-order plate compensator

Broadband spectroscopic rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Thin film optical measurement system and method with calibrating el...

Broadband spectroscopic rotating compensator ellipsometer

Thin film optical measurement system and method with calibrating el...

Patents Applicationslast 30 patents

Normal incidence rotating compensator ellipsometer

Normal incidence rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Broadband spectroscopic rotating compensator ellipsometer

Thin film optical measurement system and method with calibrating el...