David E. Bien

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Glendale, AZ, US

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Patents Grantslast 30 patents

Information Patent Grant
Sensor device with reduced parasitic-induced error
- Patent number 8,096,179
- Issue date Jan 17, 2012
- FREESCALE SEMICONDUCTOR, INC.
- David E. Bien
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Matched multiplier circuit having reduced phase shift for use in ME...
- Patent number 8,082,789
- Issue date Dec 27, 2011
- FREESCALE SEMICONDUCTOR, INC.
- Dejan Mijuskovic
- G01 - MEASURING TESTING
Information Patent Grant
Stacked cascode current source
- Patent number 7,724,077
- Issue date May 25, 2010
- FREESCALE SEMICONDUCTOR, INC.
- David E. Bien
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR DEVICE WITH REDUCED PARASITIC-INDUCED ERROR
- Publication number 20100259318
- Publication date Oct 14, 2010
- FREESCALE SEMICONDUCTOR, INC.
- David E. Bien
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MATCHED MULTIPLIER CIRCUIT HAVING REDUCED PHASE SHIFT FOR USE IN ME...
- Publication number 20100083754
- Publication date Apr 8, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Dejan Mijuskovic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STACKED CASCODE CURRENT SOURCE
- Publication number 20100019806
- Publication date Jan 28, 2010
- FREESCALE SEMICONDUCTOR, INC.
- David E. Bien
- G05 - CONTROLLING REGULATING