David E. Bugay

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West Lafayette, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for matching diffraction patterns
- Patent number 7,715,527
- Issue date May 11, 2010
- Aptuit (Kansas City), LLC
- Igor Ivanisevic
- G01 - MEASURING TESTING
Information Patent Grant
System and method for matching diffraction patterns
- Patent number 7,372,941
- Issue date May 13, 2008
- S.S.C.I., Inc.
- Igor Ivanisevic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Matching Diffraction Patterns
- Publication number 20080120051
- Publication date May 22, 2008
- SSCI, INC.
- Igor IVANISEVIC
- G01 - MEASURING TESTING
Information Patent Application
System and method for matching diffraction patterns
- Publication number 20040103130
- Publication date May 27, 2004
- Igor Ivanisevic
- G01 - MEASURING TESTING