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David E. Diller
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Greenwood Village, CO, US
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Patents Grants
last 30 patents
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Patent Grant
System and method for microseismic data acquisition using sensor pa...
Patent number
9,772,414
Issue date
Sep 26, 2017
NANOSEIS LLC
David E. Diller
G01 - MEASURING TESTING
Information
Patent Grant
System and method for narrow beam scanning microseismic monitoring
Patent number
9,395,456
Issue date
Jul 19, 2016
NANOSEIS LLC
David E. Diller
G01 - MEASURING TESTING
Information
Patent Grant
Method for imaging microseismic events using an azimuthally-depende...
Patent number
9,001,619
Issue date
Apr 7, 2015
Global Microseismic Services, Inc.
David Diller
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OIL AND GAS WELL MULTI-PHASE FLUID FLOW MONITORING WITH MULTIPLE TR...
Publication number
20230144034
Publication date
May 11, 2023
NanoSeis, LLC
Julian Drew
E21 - EARTH DRILLING MINING
Information
Patent Application
System and Method for Microseismic Data Acquisition Using Sensor Pa...
Publication number
20160202373
Publication date
Jul 14, 2016
NanoSeis LLC
David E. Diller
G01 - MEASURING TESTING
Information
Patent Application
Microseismic Event Verification Using Sub-stacks
Publication number
20140019057
Publication date
Jan 16, 2014
NANOSEIS LLC
David E. Diller
G01 - MEASURING TESTING
Information
Patent Application
Method for Imaging Microseismic Events Using an Azimuthally-depende...
Publication number
20130100770
Publication date
Apr 25, 2013
Global Microseismic Services, Inc.
David Diller
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Narrow Beam Scanning Microseismic Monitoring
Publication number
20130054147
Publication date
Feb 28, 2013
NANOSEIS LLC
David E. Diller
G01 - MEASURING TESTING