David E. Harris

Person

Powell, OH, US

People

Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for binocular measurement system
- Patent number 6,314,812
- Issue date Nov 13, 2001
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
System for the measurement of the cut length of moving articles
- Patent number 6,201,604
- Issue date Mar 13, 2001
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for binocular measurement system
- Patent number 6,196,068
- Issue date Mar 6, 2001
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting small holes in moving articles
- Patent number 6,104,037
- Issue date Aug 15, 2000
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
System for the measurement of the cut length of moving articles
- Patent number 6,052,192
- Issue date Apr 18, 2000
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting small holes in moving articles
- Patent number 5,969,373
- Issue date Oct 19, 1999
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for binocular measurement system
- Patent number 5,911,161
- Issue date Jun 8, 1999
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
System for the measurement of the cut length of moving articles
- Patent number 5,867,274
- Issue date Feb 2, 1999
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for binocular measurement system
- Patent number 5,821,423
- Issue date Oct 13, 1998
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
System for detecting small holes in moving articles
- Patent number 5,798,531
- Issue date Aug 25, 1998
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for binocular measurement system
- Patent number 5,546,808
- Issue date Aug 20, 1996
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus employing a linear array IR region radiation d...
- Patent number 5,347,135
- Issue date Sep 13, 1994
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for edge detection and location
- Patent number 5,220,177
- Issue date Jun 15, 1993
- Harris Instrument Corporation
- David E. Harris
- G01 - MEASURING TESTING

David E. Harris

Person

Patents Grantslast 30 patents

Apparatus and method for binocular measurement system

System for the measurement of the cut length of moving articles

Apparatus and method for binocular measurement system

System for detecting small holes in moving articles

System for the measurement of the cut length of moving articles

System for detecting small holes in moving articles

Apparatus and method for binocular measurement system

System for the measurement of the cut length of moving articles

Apparatus and method for binocular measurement system

System for detecting small holes in moving articles

Apparatus and method for binocular measurement system

Method and apparatus employing a linear array IR region radiation d...

Method and apparatus for edge detection and location