David E. Kloster

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Wide area soft defect localization
- Patent number 7,884,633
- Issue date Feb 8, 2011
- Advanced Micro Devices, Inc.
- Ronald M. Potok
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wide Area Soft Defect Localization
- Publication number 20090302880
- Publication date Dec 10, 2009
- Ronald M. Potok
- G01 - MEASURING TESTING