David Edward Halter

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for electrical testing
- Patent number 7,777,509
- Issue date Aug 17, 2010
- FREESCALE SEMICONDUCTOR, INC.
- David E. Halter
- G01 - MEASURING TESTING
Information Patent Grant
Data processing system and method included within an oscilloscope f...
- Patent number 6,845,331
- Issue date Jan 18, 2005
- International Business Machines Corporation
- Scott Leonard Daniels
- G01 - MEASURING TESTING
Information Patent Grant
Data processing system and method included within an oscilloscope f...
- Patent number 6,421,619
- Issue date Jul 16, 2002
- International Business Machines Corporation
- Scott Leonard Daniels
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR ELECTRICAL TESTING
- Publication number 20090267624
- Publication date Oct 29, 2009
- David E. Halter
- G01 - MEASURING TESTING
Information Patent Application
Data processing system and method included within an oscilloscope f...
- Publication number 20030229460
- Publication date Dec 11, 2003
- International Business Machines Corp.
- Scott Leonard Daniels
- G01 - MEASURING TESTING