David Fatke

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Austin, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for endpoint detection using partial least squ...
- Patent number 7,297,287
- Issue date Nov 20, 2007
- Tokyo Electron Limited
- David Fatke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for automatic configuration of processing system
- Patent number 7,213,478
- Issue date May 8, 2007
- Tokyo Electron Limited
- Satoshi Harada
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for endpoint detection using partial least squ...
- Publication number 20050016947
- Publication date Jan 27, 2005
- David Fatke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for automatic configuration of processing system
- Publication number 20050015176
- Publication date Jan 20, 2005
- TOKYO ELECTRON LIMITED
- Satoshi Harada
- G05 - CONTROLLING REGULATING