David Foord

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Ion implantation to alter etch rate
- Patent number 10,325,754
- Issue date Jun 18, 2019
- FEI Company
- David Foord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing tomographic imaging of a sample in a charged-p...
- Patent number 9,618,460
- Issue date Apr 11, 2017
- FEI Company
- Remco Schoenmakers
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
TEM sample mounting geometry
- Patent number 9,514,913
- Issue date Dec 6, 2016
- FEI Company
- David Foord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of preparing and imaging a lamella in a particle-optical app...
- Patent number 8,766,214
- Issue date Jul 1, 2014
- FEI Company
- Brian Roberts Routh
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TEM SAMPLE MOUNTING GEOMETRY
- Publication number 20160020065
- Publication date Jan 21, 2016
- FEI Company
- David Foord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Implantation to Alter Etch Rate
- Publication number 20150348752
- Publication date Dec 3, 2015
- FEI Company
- David Foord
- G01 - MEASURING TESTING
Information Patent Application
Method of Performing Tomographic Imaging of a Sample in a Charged-P...
- Publication number 20140070095
- Publication date Mar 13, 2014
- FEI Company
- Remco Schoenmakers
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APP...
- Publication number 20140007307
- Publication date Jan 2, 2014
- Brian Roberts Routh
- B82 - NANO-TECHNOLOGY