David Fryer

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Increasing photoresist processing throughput
- Patent number 8,617,784
- Issue date Dec 31, 2013
- Intel Corporation
- David Fryer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer level alignment structures using subwavelength grating polari...
- Patent number 8,004,678
- Issue date Aug 23, 2011
- Intel Corporation
- Martin Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Thermal analysis and characterization of layers and multiple layer...
- Patent number 7,048,434
- Issue date May 23, 2006
- Intel Corporation
- Alex Tregub
- G01 - MEASURING TESTING
Information Patent Grant
Thermal proximity effects in lithography
- Patent number 6,993,742
- Issue date Jan 31, 2006
- Intel Corporation
- David S. Fryer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Wafer level alignment structures using subwavelength grating polari...
- Publication number 20090002706
- Publication date Jan 1, 2009
- Martin Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Increasing photoresist processing throughput
- Publication number 20070275323
- Publication date Nov 29, 2007
- David Fryer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Thermal proximity effects in lithography
- Publication number 20050030495
- Publication date Feb 10, 2005
- David S. Fryer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Thermal analysis and characterization of layers and multiple layer...
- Publication number 20040054495
- Publication date Mar 18, 2004
- Alex Tregub
- G01 - MEASURING TESTING