David G. Brochu JR.

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Hardwick, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Test structures for dielectric reliability evaluations
- Patent number 10,103,060
- Issue date Oct 16, 2018
- GLOBALFOUNDRIES Inc.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Dual L-shaped drift regions in an LDMOS device and method of making...
- Patent number 9,059,281
- Issue date Jun 16, 2015
- International Business Machines Corporation
- David G. Brochu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure, method and circuit for simultaneously testing time...
- Patent number 8,754,655
- Issue date Jun 17, 2014
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Measuring bias temperature instability induced ring oscillator freq...
- Patent number 8,587,383
- Issue date Nov 19, 2013
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST STRUCTURES FOR DIELECTRIC RELIABILITY EVALUATIONS
- Publication number 20160372389
- Publication date Dec 22, 2016
- GLOBALFOUNDRIES INC.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
DUAL L-SHAPED DRIFT REGIONS IN AN LDMOS DEVICE AND METHOD OF MAKING...
- Publication number 20150014771
- Publication date Jan 15, 2015
- International Business Machines Corporation
- David G. Brochu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASURING BIAS TEMPERATURE INSTABILITY INDUCED RING OSCILLATOR FREQ...
- Publication number 20130147562
- Publication date Jun 13, 2013
- Internatinal Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Application
TEST STRUCTURE, METHOD AND CIRCUIT FOR SIMULTANEOUSLY TESTING TIME...
- Publication number 20130038334
- Publication date Feb 14, 2013
- International Business Machines Corporation
- David G. Brochu
- G01 - MEASURING TESTING