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David G. Scott
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Endwell, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system for improving efficiency of sequential test compr...
Patent number
9,817,068
Issue date
Nov 14, 2017
Cadence Design Systems, Inc.
Vivek Chickermane
G01 - MEASURING TESTING
Information
Patent Grant
Elastic compression-optimizing tester bandwidth with compressed tes...
Patent number
9,470,754
Issue date
Oct 18, 2016
Cadence Design Systems, Inc.
Vivek Chickermane
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for object-oriented load testing of computing...
Patent number
8,789,021
Issue date
Jul 22, 2014
International Business Machines Corporation
Kevin Mooney
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Computer method and system for automatically creating tests for che...
Patent number
7,707,553
Issue date
Apr 27, 2010
International Business Machines Corporation
Olivier Roques
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for identifying test points to optimize the testing of integ...
Patent number
6,782,515
Issue date
Aug 24, 2004
Cadence Design Systems, Inc.
David G. Scott
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
DATA ACQUISITION SYSTEM AND METHOD
Publication number
20080162687
Publication date
Jul 3, 2008
David Alan Scott
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Computer method and system for automatically creating tests for che...
Publication number
20070240127
Publication date
Oct 11, 2007
Olivier Roques
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for object-oriented load testing of computing...
Publication number
20070006045
Publication date
Jan 4, 2007
International Business Machines Corporation
Kevin Mooney
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method for identifying test points to optimize the testing of integ...
Publication number
20030154432
Publication date
Aug 14, 2003
International Business Machines Corporation
David G. Scott
G01 - MEASURING TESTING