David G. Watson

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Eden Prairie, MN, US

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Patents Grantslast 30 patents

Information Patent Grant
Sample holder apparatus to reduce energy of electrons in an analyze...
- Patent number 8,071,942
- Issue date Dec 6, 2011
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for depth profiling and characterization of thin...
- Patent number 7,449,682
- Issue date Nov 11, 2008
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive characterization of thin films based on acquired spe...
- Patent number 6,891,158
- Issue date May 10, 2005
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Grant
Nondestructive characterization of thin films using measured basis...
- Patent number 6,800,852
- Issue date Oct 5, 2004
- ReVera Incorporated
- Paul E. Larson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SAMPLE HOLDER APPARATUS TO REDUCE ENERGY OF ELECTRONS IN AN ANALYZE...
- Publication number 20100237240
- Publication date Sep 23, 2010
- Physical Electronics USA, Inc.
- David G. Watson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and method for depth profiling and characterization of thin...
- Publication number 20040238735
- Publication date Dec 2, 2004
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive characterization of thin films using measured basis...
- Publication number 20040135081
- Publication date Jul 15, 2004
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
Nondestructive characterization of thin films based on acquired spe...
- Publication number 20040125913
- Publication date Jul 1, 2004
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING
Information Patent Application
System and method for depth profiling
- Publication number 20030080292
- Publication date May 1, 2003
- Physical Electronics, Inc.
- David G. Watson
- G01 - MEASURING TESTING
Information Patent Application
System and method for characterization of thin films
- Publication number 20030080291
- Publication date May 1, 2003
- Physical Electronics, Inc.
- Paul E. Larson
- G01 - MEASURING TESTING