David Ganapol

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Scotts Valley, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Multi-test type probe card and corresponding testing system for par...
- Patent number 10,620,236
- Issue date Apr 14, 2020
- Marvell Asia Pte, Ltd.
- David Ganapol
- G01 - MEASURING TESTING
Information Patent Grant
Heat sink blade pack for device under test testing
- Patent number 9,244,107
- Issue date Jan 26, 2016
- Marvell World Trade Ltd.
- Bruce Tirado
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit test jig
- Patent number 5,537,031
- Issue date Jul 16, 1996
- VLSI Technology, Inc.
- David L. Ganapol
- G01 - MEASURING TESTING
Information Patent Grant
System for positioning a semiconductor chip package with respect to...
- Patent number 5,124,644
- Issue date Jun 23, 1992
- VLSI Technology, Inc.
- David L. Ganapol
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-TEST TYPE PROBE CARD AND CORRESPONDING TESTING SYSTEM FOR PAR...
- Publication number 20180356444
- Publication date Dec 13, 2018
- Marvell World Trade Ltd.
- David Ganapol
- G01 - MEASURING TESTING
Information Patent Application
HEAT SINK BLADE PACK FOR DEVICE UNDER TEST TESTING
- Publication number 20140132296
- Publication date May 15, 2014
- Marvell World Trade Ltd.
- Bruce Tirado
- G01 - MEASURING TESTING