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David Gerald FARBER
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Plano, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Low damage low-k dielectric etch
Patent number
10,453,700
Issue date
Oct 22, 2019
Texas Instruments Incorporated
Ping Jiang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating semiconductors
Patent number
9,881,795
Issue date
Jan 30, 2018
Texas Instruments Incorporated
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Uniform, damage free nitride ETCH
Patent number
9,704,720
Issue date
Jul 11, 2017
Texas Instruments Incorporated
Tom Lii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating semiconductors
Patent number
9,490,143
Issue date
Nov 8, 2016
Texas Instruments Incorporated
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Uniform, damage free nitride etch
Patent number
9,437,449
Issue date
Sep 6, 2016
Texas Instruments Incorporated
Tom Lii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Hard mask for source/drain epitaxy control
Patent number
9,224,657
Issue date
Dec 29, 2015
Texas Instruments Incorporated
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a metal contact opening with a width that is smal...
Patent number
9,054,158
Issue date
Jun 9, 2015
Texas Instruments Incorporated
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Lateral uniformity in silicon recess etch
Patent number
8,507,386
Issue date
Aug 13, 2013
Texas Instruments Incorporated
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reducing line edge roughness for conductive features
Patent number
7,687,407
Issue date
Mar 30, 2010
Texas Instruments Incorporated
David G. Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for inspection sample preparation
Patent number
7,112,288
Issue date
Sep 26, 2006
Texas Instruments Incorporated
Fred Y. Clark
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of passivating and/or removing contaminants on a low-k diele...
Patent number
7,087,518
Issue date
Aug 8, 2006
Texas Instruments Incorporated
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Etch back of interconnect dielectrics
Patent number
6,780,756
Issue date
Aug 24, 2004
Texas Instruments Incorporated
David G. Farber
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
LOW DAMAGE LOW-K DIELECTRIC ETCH
Publication number
20170178955
Publication date
Jun 22, 2017
TEXAS INSTRUMENTS INCORPORATED
Ping JIANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FABRICATING SEMICONDUCTORS
Publication number
20170148634
Publication date
May 25, 2017
TEXAS INSTRUMENTS INCORPORATED
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UNIFORM, DAMAGE FREE NITRIDE ETCH
Publication number
20160343581
Publication date
Nov 24, 2016
TEXAS INSTRUMENTS INCORPORATED
Tom Lii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DUAL LAYER HARDMASK FOR EMBEDDED EPI GROWTH
Publication number
20150187661
Publication date
Jul 2, 2015
TEXAS INSTRUMENTS INCORPORATED
Tom Lii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HARD MASK FOR SOURCE/DRAIN EPITAXY CONTROL
Publication number
20150044830
Publication date
Feb 12, 2015
TEXAS INSTRUMENTS INCORPORATED
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Forming a Metal Contact Opening with a Width that is Smal...
Publication number
20140227877
Publication date
Aug 14, 2014
TEXAS INSTRUMENTS INCORPORATED
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
UNIFORM, DAMAGE FREE NITRIDE ETCH
Publication number
20140187009
Publication date
Jul 3, 2014
Tom Lii
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Lateral Uniformity in Silicon Recess Etch
Publication number
20120064686
Publication date
Mar 15, 2012
TEXAS INSTRUMENTS INCORPORATED
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SHALLOW TRENCH DIVOT CONTROL POST
Publication number
20080268589
Publication date
Oct 30, 2008
TEXAS INSTRUMENTS INCORPORATED
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for reducing line edge roughness for conductive features
Publication number
20060121739
Publication date
Jun 8, 2006
Texas Instruments, Inc.
David G. Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Etch back of interconnect dielectrics
Publication number
20040169279
Publication date
Sep 2, 2004
David G. Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ETCH BACK OF INTERCONNECT DIELECTRICS
Publication number
20040169280
Publication date
Sep 2, 2004
David G. Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Methods for inspection sample preparation
Publication number
20040033631
Publication date
Feb 19, 2004
Fred Y. Clark
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of passivating and/or removing contaminants on a low-k diele...
Publication number
20030224585
Publication date
Dec 4, 2003
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of passivating and/or removing contaminants on a low-k diele...
Publication number
20030170992
Publication date
Sep 11, 2003
David Gerald Farber
H01 - BASIC ELECTRIC ELEMENTS