David Goldovsky

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Dolev, IL

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Patents Grantslast 30 patents

Information Patent Grant
Cathodoluminescence focal scans to characterize 3D NAND CH profile
- Patent number 11,713,964
- Issue date Aug 1, 2023
- Applied Materials Israel Ltd.
- David Goldovsky
- G01 - MEASURING TESTING
Information Patent Grant
Optimizing signal-to-noise ratio in optical imaging of defects on u...
- Patent number 11,525,777
- Issue date Dec 13, 2022
- Applied Materials Israel Ltd.
- Yechiel Kapoano
- G02 - OPTICS
Information Patent Grant
Increasing signal-to-noise ratio in optical imaging of defects on u...
- Patent number 11,474,437
- Issue date Oct 18, 2022
- Applied Materials Israel Ltd.
- Yechiel Kapoano
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical inspection
- Patent number 11,105,740
- Issue date Aug 31, 2021
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CATHODOLUMINESCENCE FOCAL SCANS TO CHARACTERIZE 3D NAND CH PROFILE
- Publication number 20230221112
- Publication date Jul 13, 2023
- APPLIED MATERIALS ISRAEL LTD.
- David Goldovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTIMIZING SIGNAL-TO-NOISE RATIO IN OPTICAL IMAGING OF DEFECTS ON U...
- Publication number 20210349019
- Publication date Nov 11, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yechiel Kapoano
- G01 - MEASURING TESTING
Information Patent Application
INCREASING SIGNAL-TO-NOISE RATIO IN OPTICAL IMAGING OF DEFECTS ON U...
- Publication number 20210333719
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Yechiel Kapoano
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION
- Publication number 20210116368
- Publication date Apr 22, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Amir Shoham
- G01 - MEASURING TESTING