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David Grigg
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Glastonberry, CT, US
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Patents Grants
last 30 patents
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Patent Grant
Scanning interferometry
Patent number
7,102,761
Issue date
Sep 5, 2006
Zygo Corporation
Xavier Colonna De Lega
G01 - MEASURING TESTING
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Patent Grant
Optical systems for measuring form and geometric dimensions of prec...
Patent number
6,822,745
Issue date
Nov 23, 2004
Zygo Corporation
Peter De Groot
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Scanning interferometry
Publication number
20040252310
Publication date
Dec 16, 2004
Xavier Colonna De Lega
G01 - MEASURING TESTING
Information
Patent Application
Optical systems for measuring form and geometric dimensions of prec...
Publication number
20010043333
Publication date
Nov 22, 2001
Peter De Groot
G01 - MEASURING TESTING