David H. Armstrong

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Boulder, CO, US

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Patents Grantslast 30 patents

Information Patent Grant
Bandwidth matching for scan architectures in an integrated circuit
- Patent number 7,137,053
- Issue date Nov 14, 2006
- Verigg IPco
- Ajay Khoche
- G01 - MEASURING TESTING
Information Patent Grant
System for verifying signal timing accuracy on a digital testing de...
- Patent number 6,192,496
- Issue date Feb 20, 2001
- Agilent Technologies, Inc.
- William R. Lawrence
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Bandwidth matching for scan architectures in an integrated circuit
- Publication number 20030046623
- Publication date Mar 6, 2003
- Ajay Khoche
- G01 - MEASURING TESTING