David H. Eby

Follow

Person

Aloha, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Continuous RF signal visualization with high resolution
- Patent number 10,198,835
- Issue date Feb 5, 2019
- Tektronix, Inc.
- Kyle L. Bernard
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Appending pseudo-random sub-LSB values to prevent intensity banding
- Patent number 9,002,004
- Issue date Apr 7, 2015
- Tektronix, Inc.
- David Eby
- G01 - MEASURING TESTING
Information Patent Grant
Frequency domain bitmap triggering using color, density and correla...
- Patent number 8,489,350
- Issue date Jul 16, 2013
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Grant
Density trace measurement
- Patent number 8,452,559
- Issue date May 28, 2013
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous programmable two-stage serial/parallel counter
- Patent number 4,905,262
- Issue date Feb 27, 1990
- Tektronix, Inc.
- David H. Eby
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for controlling oscilloscope displayed menu se...
- Patent number 4,644,337
- Issue date Feb 17, 1987
- Tektronix, Inc.
- Gordon W. Shank
- G01 - MEASURING TESTING
Information Patent Grant
Programmable ripple counter having exclusive OR gates
- Patent number 4,612,658
- Issue date Sep 16, 1986
- Tektronix, Inc.
- David H. Eby
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
CONTINUOUS RF SIGNAL VISUALIZATION WITH HIGH RESOLUTION
- Publication number 20170069119
- Publication date Mar 9, 2017
- Tektronix, Inc.
- Kyle L. Bernard
- G01 - MEASURING TESTING
Information Patent Application
CONTINUOUS RF SIGNAL VISUALIZATION WITH HIGH RESOLUTION
- Publication number 20120306886
- Publication date Dec 6, 2012
- Tektronix, Inc.
- KYLE L. BERNARD
- G01 - MEASURING TESTING
Information Patent Application
RE-SAMPLING ACQUIRED DATA TO PREVENT COHERENT SAMPLING ARTIFACTS
- Publication number 20120053875
- Publication date Mar 1, 2012
- Tektronix, Inc.
- DAVID H. EBY
- G01 - MEASURING TESTING
Information Patent Application
APPENDING PSEUDO-RANDOM SUB-LSB VALUES TO PREVENT INTENSITY BANDING
- Publication number 20120051538
- Publication date Mar 1, 2012
- Tektronix, Inc.
- DAVID H. EBY
- G01 - MEASURING TESTING
Information Patent Application
DENSITY TRACE MEASUREMENT AND TRIGGERING IN FREQUENCY DOMAIN BITMAPS
- Publication number 20110282610
- Publication date Nov 17, 2011
- Tektronix, Inc.
- KATHRYN A. ENGHOLM
- G01 - MEASURING TESTING
Information Patent Application
FREQUENCY DOMAIN BITMAP TRIGGERING USING COLOR, DENSITY AND CORRELA...
- Publication number 20100231398
- Publication date Sep 16, 2010
- Tektronix, Inc.
- Kathryn A. Engholm
- G01 - MEASURING TESTING