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David Harmon Olson
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Aloha, OR, US
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last 30 patents
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Patent Grant
Accessory with internal adjustments controlled by host
Patent number
6,232,764
Issue date
May 15, 2001
Tektronix, Inc.
John B. Rettig
G01 - MEASURING TESTING
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Patent Grant
Waveform measurement system
Patent number
4,476,432
Issue date
Oct 9, 1984
Tektronix, Inc.
David H. Olson
G01 - MEASURING TESTING
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Patent Grant
Oscilloscope sweep rate indicator system
Patent number
4,097,798
Issue date
Jun 27, 1978
Tektronix, Inc.
David Harmon Olson
G01 - MEASURING TESTING