David Harry Eppes

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with increased heat transfer
- Patent number 7,259,458
- Issue date Aug 21, 2007
- Advanced Micro Devices, Inc.
- Michael Zhuoying Su
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Crack resistant scribe line monitor structure and method for making...
- Patent number 7,091,621
- Issue date Aug 15, 2006
- Advanced Micro Devices, Inc.
- David H. Eppes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit defect analysis using liquid crystal
- Patent number 6,956,385
- Issue date Oct 18, 2005
- Advanced Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit heating system and method therefor
- Patent number 6,879,172
- Issue date Apr 12, 2005
- Advanced Micro Devices, Inc.
- David Eppes
- G01 - MEASURING TESTING
Information Patent Grant
Indirect stimulation of an integrated circuit die
- Patent number 6,870,379
- Issue date Mar 22, 2005
- Advanced Micro Devices, Inc.
- Brennan V. Davis
- G01 - MEASURING TESTING
Information Patent Grant
Fiber optic semiconductor analysis arrangement and method therefor
- Patent number 6,844,928
- Issue date Jan 18, 2005
- Advanced Micro Devices, Inc.
- Glen P. Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
High resolution heat exchange
- Patent number 6,836,132
- Issue date Dec 28, 2004
- Advance Micro Devices, Inc.
- Michael R. Bruce
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit internal heating system and method therefor
- Patent number 6,815,965
- Issue date Nov 9, 2004
- Advanced Micro Devices, Inc.
- David Eppes
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis arrangement and method therefor
- Patent number 6,700,659
- Issue date Mar 2, 2004
- Advanced Micro Devices, Inc.
- Srikar V. Chunduri
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor analysis arrangement and method therefor
- Patent number 6,635,839
- Issue date Oct 21, 2003
- Advanced Micro Devices, Inc.
- Glen P. Gilfeather
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection using liquid crystal and internal heat source
- Patent number 6,599,762
- Issue date Jul 29, 2003
- Advanced Micro Devices, Inc.
- David Harry Eppes
- G01 - MEASURING TESTING
Information Patent Grant
Time-lapsed IC defect analysis using liquid crystal
- Patent number 6,576,195
- Issue date Jun 10, 2003
- Advanced Micro Devices, Inc.
- David Harry Eppes
- G01 - MEASURING TESTING
Information Patent Grant
Data processing device test apparatus and method therefor
- Patent number 6,546,513
- Issue date Apr 8, 2003
- Advanced Micro Devices
- Richard Jacob Wilcox
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Flip chip defect analysis using liquid crystal
- Patent number 6,488,405
- Issue date Dec 3, 2002
- Advanced Micro Devices, Inc.
- David Harry Eppes
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit with increased heat transfer
- Publication number 20060038283
- Publication date Feb 23, 2006
- Advanced Micro Devices, Inc.
- Michael Zhuoying Su
- H01 - BASIC ELECTRIC ELEMENTS

David Harry Eppes

Person

Patents Grantslast 30 patents

Integrated circuit with increased heat transfer

Crack resistant scribe line monitor structure and method for making...

Integrated circuit defect analysis using liquid crystal

Integrated circuit heating system and method therefor

Indirect stimulation of an integrated circuit die

Fiber optic semiconductor analysis arrangement and method therefor

High resolution heat exchange

Integrated circuit internal heating system and method therefor

Semiconductor analysis arrangement and method therefor

Semiconductor analysis arrangement and method therefor

Defect detection using liquid crystal and internal heat source

Time-lapsed IC defect analysis using liquid crystal

Data processing device test apparatus and method therefor

Flip chip defect analysis using liquid crystal

Patents Applicationslast 30 patents

Integrated circuit with increased heat transfer