David J. Heine

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Pleasanton, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for electrical determination of delamination a...
- Patent number 6,066,561
- Issue date May 23, 2000
- LSI Logic Corporation
- Kiran Kumar
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit with tungsten plug containing amorphization layer
- Patent number 6,016,009
- Issue date Jan 18, 2000
- LSI Logic Corporation
- Valeriy Y. Sukharev
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Multistep tungsten CVD process with amorphization step
- Patent number 5,804,249
- Issue date Sep 8, 1998
- LSI Logic Corporation
- Valeriy Y. Sukharev
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...