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DAVID J. MONK
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MESA, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Integrating diverse sensors in a single semiconductor device
Patent number
11,021,363
Issue date
Jun 1, 2021
NXP USA, INC.
Lianjun Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrating diverse sensors in a single semiconductor device
Patent number
10,364,140
Issue date
Jul 30, 2019
NXP USA, INC.
Lianjun Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Electric field sensor, system, and method for programming electroni...
Patent number
9,784,787
Issue date
Oct 10, 2017
NXP USA, INC.
Lianjun Liu
G01 - MEASURING TESTING
Information
Patent Grant
Optical programming of electronic devices on a wafer
Patent number
9,607,911
Issue date
Mar 28, 2017
NXP USA, INC.
Lianjun Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vertically integrated MEMS sensor device with multi-stimulus sensing
Patent number
8,220,330
Issue date
Jul 17, 2012
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Multiple axis transducer with multiple sensing range capability
Patent number
7,779,689
Issue date
Aug 24, 2010
FREESCALE SEMICONDUCTOR, INC.
Gary G. Li
G01 - MEASURING TESTING
Information
Patent Grant
Method of using a differential pressure type flowmeter
Patent number
7,437,951
Issue date
Oct 21, 2008
FREESCALE SEMICONDUCTOR, INC.
William G. McDonald
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Flowmeter and method for the making thereof
Patent number
7,261,003
Issue date
Aug 28, 2007
FREESCALE SEMICONDUCTOR, INC.
William G. McDonald
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Structure to reduce signal cross-talk through semiconductor substra...
Patent number
7,052,939
Issue date
May 30, 2006
FREESCALE SEMICONDUCTOR, INC.
Wen Ling M. Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SOI polysilicon trench refill perimeter oxide anchor scheme
Patent number
6,913,941
Issue date
Jul 5, 2005
Freescale Semiconductor, Inc.
Gary J. O'Brien
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Component having a filter
Patent number
6,769,319
Issue date
Aug 3, 2004
FREESCALE SEMICONDUCTOR, INC.
William G. McDonald
G01 - MEASURING TESTING
Information
Patent Grant
Method of forming an integrated CMOS capacitive pressure sensor
Patent number
6,472,243
Issue date
Oct 29, 2002
Motorola, Inc.
Bishnu P. Gogoi
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a semiconductor component having a fixed el...
Patent number
6,426,239
Issue date
Jul 30, 2002
Motorola, Inc.
Bishnu P. Gogoi
G01 - MEASURING TESTING
Information
Patent Grant
Micro electro-mechanical system sensor with selective encapsulation...
Patent number
6,401,545
Issue date
Jun 11, 2002
Motorola, Inc.
David J. Monk
G01 - MEASURING TESTING
Information
Patent Grant
Method of manufacturing a sensor
Patent number
6,352,874
Issue date
Mar 5, 2002
Motorola Inc.
Andrew C. McNeil
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor component and method of manufacture
Patent number
6,156,585
Issue date
Dec 5, 2000
Motorola, Inc.
Bishnu P. Gogoi
G01 - MEASURING TESTING
Information
Patent Grant
Method of testing sensors and apparatus therefor
Patent number
6,134,941
Issue date
Oct 24, 2000
Motorola, Inc.
Jerry D. Cripe
G01 - MEASURING TESTING
Information
Patent Grant
Temperature coefficient of offset adjusted semiconductor device and...
Patent number
5,994,161
Issue date
Nov 30, 1999
Motorola, Inc.
Gordon D. Bitko
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Media compatible microsensor structure and methods of manufacturing...
Patent number
5,889,211
Issue date
Mar 30, 1999
Motorola, Inc.
Theresa A. Maudie
G01 - MEASURING TESTING
Information
Patent Grant
Electronic sensor assembly having metal interconnections isolated f...
Patent number
5,646,072
Issue date
Jul 8, 1997
Motorola, Inc.
Theresa Maudie
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit isolation structure for suppressing high-frequen...
Patent number
5,623,159
Issue date
Apr 22, 1997
Motorola, Inc.
David J. Monk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Vertically integrated sensor structure and method
Patent number
5,600,071
Issue date
Feb 4, 1997
Motorola, Inc.
K. Sooriakumar
G01 - MEASURING TESTING
Information
Patent Grant
Isolated well and method of making
Patent number
5,394,007
Issue date
Feb 28, 1995
Motorola, Inc.
Robert H. Reuss
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Forming a vertical PNP transistor
Patent number
5,302,534
Issue date
Apr 12, 1994
Motorola, Inc.
David J. Monk
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming isolated wells in the fabrication of BiCMOS devices
Patent number
5,268,312
Issue date
Dec 7, 1993
Motorola, Inc.
Robert H. Reuss
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
INTEGRATING DIVERSE SENSORS IN A SINGLE SEMICONDUCTOR DEVICE
Publication number
20170081174
Publication date
Mar 23, 2017
FREESCALE SEMICONDUCTOR, INC.
LIANJUN LIU
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
ELECTRIC FIELD SENSOR, SYSTEM, AND METHOD FOR PROGRAMMING ELECTRONI...
Publication number
20160306007
Publication date
Oct 20, 2016
FREESCALE SEMICONDUCTOR, INC.
LIANJUN LIU
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL PROGRAMMING OF ELECTRONIC DEVICES ON A WAFER
Publication number
20160276231
Publication date
Sep 22, 2016
FREESCALE SEMICONDUCTOR, INC.
LIANJUN LIU
G01 - MEASURING TESTING
Information
Patent Application
WAFER-LEVEL MAGNETIC FIELD PROGRAMMING OF MAGNETIC FIELD SENSORS
Publication number
20160274188
Publication date
Sep 22, 2016
FREESCALE SEMICONDUCTOR, INC.
LIANJUN LIU
G01 - MEASURING TESTING
Information
Patent Application
SENSOR DEVICE WITH MULTI-STIMULUS SENSING AND METHOD OF FABRICATION
Publication number
20160264403
Publication date
Sep 15, 2016
FREESCALE SEMICONDUCTO, INC.
MAMUR CHOWDHURY
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS SENSOR DEVICE WITH MULTI-STIMULUS SENSING AND METHOD OF FABRIC...
Publication number
20150102437
Publication date
Apr 16, 2015
FREESCALE SEMICONDUCTOR, INC.
Lianjun Liu
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
VERTICALLY INTEGRATED MEMS SENSOR DEVICE WITH MULTI-STIMULUS SENSING
Publication number
20100242603
Publication date
Sep 30, 2010
FREESCALE SEMICONDUCTOR, INC.
Todd F. Miller
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MULTIPLE AXIS TRANSDUCER WITH MULTIPLE SENSING RANGE CAPABILITY
Publication number
20080196499
Publication date
Aug 21, 2008
FREESCALE SEMICONDUCTOR, INC.
Gary G. Li
G01 - MEASURING TESTING
Information
Patent Application
FLOWMETER AND METHOD FOR THE MAKING THEREOF
Publication number
20070277623
Publication date
Dec 6, 2007
FREESCALE SEMICONDUCTOR, INC.
William G. McDonald
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
FLOWMETER AND METHOD FOR THE MAKING THEREOF
Publication number
20070151366
Publication date
Jul 5, 2007
William G. McDonald
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
Structure to reduce signal cross-talk through semiconductor substra...
Publication number
20040099878
Publication date
May 27, 2004
MOTOROLA, INC.
Wen Ling M. Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOI polysilicon trench refill perimeter oxide anchor scheme
Publication number
20040048410
Publication date
Mar 11, 2004
MOTOROLA INC.
Gary J. O'Brien
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Integrated circuit structure for mixed-signal RF applications and c...
Publication number
20030234438
Publication date
Dec 25, 2003
MOTOROLA, INC.
Wen Ling M Huang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Component having a filter and method of manufacturing
Publication number
20030005782
Publication date
Jan 9, 2003
MOTOROLA, INC.
William G. McDonald
G01 - MEASURING TESTING
Information
Patent Application
Integrated CMOS capacitive pressure sensor
Publication number
20020072144
Publication date
Jun 13, 2002
Bishnu P. Gogoi
G01 - MEASURING TESTING
Information
Patent Application
PHYSICAL SENSOR COMPONENT
Publication number
20020050170
Publication date
May 2, 2002
SLOBODAN PETROVIC
G01 - MEASURING TESTING