David J. Ray

Person

Mendon, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integrated scanning probe microscope and confocal microscope
- Patent number 7,692,138
- Issue date Apr 6, 2010
- David James Ray
- G01 - MEASURING TESTING
Information Patent Grant
Removable probe sensor assembly and scanning probe microscope
- Patent number 6,910,368
- Issue date Jun 28, 2005
- Raymax Technology, Inc.
- David J Ray
- G01 - MEASURING TESTING
Information Patent Grant
Method for replacing a probe sensor assembly on a scanning probe mi...
- Patent number 6,748,794
- Issue date Jun 15, 2004
- David James Ray
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope system including removable probe sensor a...
- Patent number 6,415,654
- Issue date Jul 9, 2002
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detection system for atomic force microscopes
- Patent number RE37404
- Issue date Oct 9, 2001
- Quesant Instrument Corporation
- Robert S. Harp
- 073 - Measuring and testing
Information Patent Grant
Scanning force microscope and method for beam detection and alignment
- Patent number 6,189,373
- Issue date Feb 20, 2001
- Ray Max Technology, Inc.
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope system including removable probe sensor a...
- Patent number 6,138,503
- Issue date Oct 31, 2000
- Raymax Technology, Inc.
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope with removable probe illuminator assembly
- Patent number 5,874,669
- Issue date Feb 23, 1999
- Raymax Technology, Inc.
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning force microscope
- Patent number 5,861,550
- Issue date Jan 19, 1999
- RayMax Technology, Incorporated
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of engaging the scanning probe of a scanning probe microscop...
- Patent number 5,614,712
- Issue date Mar 25, 1997
- Quesant Instrument Corporation
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detecting system for scanning microscopes
- Patent number 5,524,479
- Issue date Jun 11, 1996
- Ouesant Instrument Corporation
- Robert S. Harp
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Programmable, scanned-probe microscope system and method
- Patent number 5,466,935
- Issue date Nov 14, 1995
- Quesant Instrument Corporation
- David J. Ray
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Detection system for atomic force microscopes
- Patent number 5,388,452
- Issue date Feb 14, 1995
- Quesant Instrument Corporation
- Robert S. Harp
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Light modulated detection system for atomic force microscopes
- Patent number 5,357,105
- Issue date Oct 18, 1994
- Quesant Instrument Corporation
- Robert S. Harp
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
Probe module with integrated actuator for a probe microscope
- Publication number 20070144244
- Publication date Jun 28, 2007
- Karma Technology, Inc.
- David J. Ray
- G01 - MEASURING TESTING
Information Patent Application
Removable probe sensor assembly and scanning probe microscope
- Publication number 20040250608
- Publication date Dec 16, 2004
- David J. Ray
- G01 - MEASURING TESTING
Information Patent Application
Method for replacing a probe sensor assembly on a scanning probe mi...
- Publication number 20020174716
- Publication date Nov 28, 2002
- David James Ray
- B82 - NANO-TECHNOLOGY

David J. Ray

Person

Patents Grantslast 30 patents

Integrated scanning probe microscope and confocal microscope

Removable probe sensor assembly and scanning probe microscope

Method for replacing a probe sensor assembly on a scanning probe mi...

Scanning probe microscope system including removable probe sensor a...

Detection system for atomic force microscopes

Scanning force microscope and method for beam detection and alignment

Scanning probe microscope system including removable probe sensor a...

Scanning force microscope with removable probe illuminator assembly

Scanning force microscope

Method of engaging the scanning probe of a scanning probe microscop...

Detecting system for scanning microscopes

Programmable, scanned-probe microscope system and method

Detection system for atomic force microscopes

Light modulated detection system for atomic force microscopes

Patents Applicationslast 30 patents

Probe module with integrated actuator for a probe microscope

Removable probe sensor assembly and scanning probe microscope

Method for replacing a probe sensor assembly on a scanning probe mi...