David J. Stein

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Albuquerque, NM, US

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Patents Grantslast 30 patents

Information Patent Grant
Power spectrum analysis for defect screening in integrated circuit...
- Patent number 9,188,622
- Issue date Nov 17, 2015
- Sandia Corporation
- Paiboon Tangyunyong
- G01 - MEASURING TESTING
Information Patent Grant
Hardware device to physical structure binding and authentication
- Patent number 8,516,269
- Issue date Aug 20, 2013
- Sandia Corporation
- Jason R. Hamlet
- H04 - ELECTRIC COMMUNICATION TECHNIQUE