DAVID J. TASKER

Person

Portland, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,581,526
- Issue date Feb 28, 2017
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 9,275,831
- Issue date Mar 1, 2016
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 8,890,064
- Issue date Nov 18, 2014
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Method for S/TEM sample analysis
- Patent number 8,455,821
- Issue date Jun 4, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 8,095,231
- Issue date Jan 10, 2012
- FEI Company
- David J. Tasker
- G05 - CONTROLLING REGULATING
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 7,664,566
- Issue date Feb 16, 2010
- FEI Company
- David J. Tasker
- G01 - MEASURING TESTING
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 7,308,334
- Issue date Dec 11, 2007
- FEI Company
- David J. Tasker
- G01 - MEASURING TESTING
Information Patent Grant
Graphical automated machine control and metrology
- Patent number 6,889,113
- Issue date May 3, 2005
- FEI Company
- David J. Tasker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20160163506
- Publication date Jun 9, 2016
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for S/TEM Sample Analysis
- Publication number 20150206707
- Publication date Jul 23, 2015
- FEI Company
- Jason Arjavac
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20130341505
- Publication date Dec 26, 2013
- FEI Company
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
- Publication number 20110006207
- Publication date Jan 13, 2011
- FEI COMPANY
- Jason Arjavac
- G01 - MEASURING TESTING
Information Patent Application
GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY
- Publication number 20100138028
- Publication date Jun 3, 2010
- FEI Company
- DAVID J. TASKER
- G05 - CONTROLLING REGULATING
Information Patent Application
GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY
- Publication number 20080097621
- Publication date Apr 24, 2008
- FEI Company
- DAVID J. TASKER
- G05 - CONTROLLING REGULATING
Information Patent Application
Graphical automated machine control and metrology
- Publication number 20050188309
- Publication date Aug 25, 2005
- FEI Company
- David J. Tasker
- G05 - CONTROLLING REGULATING
Information Patent Application
Graphical automated machine control and metrology
- Publication number 20030067496
- Publication date Apr 10, 2003
- David J. Tasker
- G01 - MEASURING TESTING

DAVID J. TASKER

Person

Patents Grantslast 30 patents

Method for S/TEM sample analysis

Method for S/TEM sample analysis

Method for S/TEM sample analysis

Method for S/TEM sample analysis

Graphical automated machine control and metrology

Graphical automated machine control and metrology

Graphical automated machine control and metrology

Graphical automated machine control and metrology

Patents Applicationslast 30 patents

METHOD FOR S/TEM SAMPLE ANALYSIS

Method for S/TEM Sample Analysis

METHOD FOR S/TEM SAMPLE ANALYSIS

METHOD FOR S/TEM SAMPLE ANALYSIS

GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY

GRAPHICAL AUTOMATED MACHINE CONTROL AND METROLOGY

Graphical automated machine control and metrology

Graphical automated machine control and metrology