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David J. Watson
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Richland, WA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Methods for identification and verification
Patent number
6,477,227
Issue date
Nov 5, 2002
KeyMaster Technologies, Inc.
Bruce J. Kaiser
G01 - MEASURING TESTING
Information
Patent Grant
Eddy current flexible field probe deployed through a loading platform
Patent number
6,198,280
Issue date
Mar 6, 2001
Siemens Westinghouse Power Corporation
Gary Lee Hensley
G01 - MEASURING TESTING
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Patent Grant
Flexible eddy current test probe
Patent number
6,114,849
Issue date
Sep 5, 2000
United Western Technologies Corp.
Larry Stephen Price
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Methods for identification and verification
Publication number
20030058990
Publication date
Mar 27, 2003
Bruce J. Kaiser
G01 - MEASURING TESTING
Information
Patent Application
X-ray source and method of using the same
Publication number
20030048877
Publication date
Mar 13, 2003
L. Stephen Price
G01 - MEASURING TESTING
Information
Patent Application
Methods for identification and verification
Publication number
20020094058
Publication date
Jul 18, 2002
Bruce J. Kaiser
G01 - MEASURING TESTING