David John Lind

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North Andover, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Programmable test instrument
- Patent number 10,776,233
- Issue date Sep 15, 2020
- Teradyne, Inc.
- Lloyd K. Frick
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrated multi-channel analog test instrument architecture provid...
- Patent number 6,363,507
- Issue date Mar 26, 2002
- Teradyne, Inc.
- Eric L. Truebenbach
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE TEST INSTRUMENT
- Publication number 20130111505
- Publication date May 2, 2013
- Teradyne, Inc.
- Lloyd K. Frick
- G06 - COMPUTING CALCULATING COUNTING