David Kaushansky

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Belmont, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Functional testing with inline parametric testing
- Patent number 11,408,927
- Issue date Aug 9, 2022
- Teradyne, Inc.
- David Kaushansky
- G01 - MEASURING TESTING
Information Patent Grant
Programmable test instrument
- Patent number 9,759,772
- Issue date Sep 12, 2017
- Teradyne, Inc.
- David Kaushansky
- G01 - MEASURING TESTING
Information Patent Grant
Test instrument having a configurable interface
- Patent number 9,470,759
- Issue date Oct 18, 2016
- Teradyne, Inc.
- Stephen J. Bourassa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FUNCTIONAL TESTING WITH INLINE PARAMETRIC TESTING
- Publication number 20200400741
- Publication date Dec 24, 2020
- Teradyne, Inc.
- David Kaushansky
- G01 - MEASURING TESTING
Information Patent Application
PROGRAMMABLE TEST INSTRUMENT
- Publication number 20130110445
- Publication date May 2, 2013
- Teradyne, Inc.
- David Kaushansky
- G01 - MEASURING TESTING
Information Patent Application
TEST INSTRUMENT HAVING A CONFIGURABLE INTERFACE
- Publication number 20130110446
- Publication date May 2, 2013
- Teradyne, Inc.
- Stephen J. Bourassa
- G01 - MEASURING TESTING