David Keith

Person

Vancouver, WA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 9,612,259
- Issue date Apr 4, 2017
- Translarity, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing system and associated methods of use and manufacture
- Patent number 8,872,533
- Issue date Oct 28, 2014
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Wafer testing systems and associated methods of use and manufacture
- Patent number 8,405,414
- Issue date Mar 26, 2013
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive, optically addressed, photosensitive spatial light mod...
- Patent number 7,990,600
- Issue date Aug 2, 2011
- Compound Photonics Limited
- Jonathan A. Sachs
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20170219629
- Publication date Aug 3, 2017
- TRANSLARITY, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20150015292
- Publication date Jan 15, 2015
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20130314115
- Publication date Nov 28, 2013
- ADVANCED INQUIRY SYSTEMS, INC.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
WAFER TESTING SYSTEMS AND ASSOCIATED METHODS OF USE AND MANUFACTURE
- Publication number 20120074976
- Publication date Mar 29, 2012
- Advanced Inquiry Systems, Inc.
- Aaron Durbin
- G01 - MEASURING TESTING
Information Patent Application
Transmissive, Optically Addressed, Photosensitive Spatial Light Mod...
- Publication number 20080239458
- Publication date Oct 2, 2008
- Jonathan A. Sachs
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Structure of liquid crystal cells and projection lenses and image p...
- Publication number 20050213052
- Publication date Sep 29, 2005
- Iljin Diamond Co., Ltd.
- David L. Keith
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Digital light valve addressing methods and apparatus and light valv...
- Publication number 20020149557
- Publication date Oct 17, 2002
- Sarif, Inc.
- Howard V. Goetz
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

David Keith

Person

Patents Grantslast 30 patents

Wafer testing system and associated methods of use and manufacture

Wafer testing system and associated methods of use and manufacture

Wafer testing systems and associated methods of use and manufacture

Transmissive, optically addressed, photosensitive spatial light mod...

Patents Applicationslast 30 patents

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

WAFER TESTING SYSTEM AND ASSOCIATED METHODS OF USE AND MANUFACTURE

WAFER TESTING SYSTEMS AND ASSOCIATED METHODS OF USE AND MANUFACTURE

Transmissive, Optically Addressed, Photosensitive Spatial Light Mod...

Structure of liquid crystal cells and projection lenses and image p...

Digital light valve addressing methods and apparatus and light valv...