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David Kleinfeld
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New York, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Facing and quality control in microtomy
Patent number
12,158,404
Issue date
Dec 3, 2024
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Facing and quality control in microtomy
Patent number
11,821,826
Issue date
Nov 21, 2023
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Facing and quality control in microtomy
Patent number
11,609,162
Issue date
Mar 21, 2023
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Facing and quality control in microtomy
Patent number
11,467,071
Issue date
Oct 11, 2022
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Facing and Quality Control in Microtomy
Publication number
20230126618
Publication date
Apr 27, 2023
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
FACING AND QUALITY CONTROL IN MICROTOMY
Publication number
20220349788
Publication date
Nov 3, 2022
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Facing and Quality Control in Microtomy
Publication number
20220042887
Publication date
Feb 10, 2022
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Facing and Quality Control in Microtomy
Publication number
20220034768
Publication date
Feb 3, 2022
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Facing and Quality Control in Microtomy
Publication number
20210262907
Publication date
Aug 26, 2021
Clarapath, Inc.
Partha P. Mitra
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Facing and Quality Control in Microtomy
Publication number
20210263055
Publication date
Aug 26, 2021
Clarapath, Inc.
Partha P. Mitra
G01 - MEASURING TESTING