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David L. Graham
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Pennellville, NY, US
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last 30 patents
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Patent Grant
Method and apparatus for three dimensional wavenumber-frequency ana...
Patent number
9,453,900
Issue date
Sep 27, 2016
Lockheed Martin Corporation
John R. MacGillivray
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD AND APPARATUS FOR THREE DIMENSIONAL WAVENUMBER-FREQUENCY ANA...
Publication number
20140269197
Publication date
Sep 18, 2014
John R. MacGillivray
G01 - MEASURING TESTING