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Film inspection system
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Patent number 4,652,124
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Issue date Mar 24, 1987
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Research Technology International
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Howard Bowen
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G01 - MEASURING TESTING
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Film inspection system
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Patent number 4,652,125
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Issue date Mar 24, 1987
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Research Technology International
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Howard Bowen
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G01 - MEASURING TESTING
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Film thickness detector
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Patent number 4,166,700
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Issue date Sep 4, 1979
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Research Technology, Inc.
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Howard Bowen
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G01 - MEASURING TESTING
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