David L. Vonder

Follow

Person

Addison, IL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Chip carrier socket test probe
- Patent number 4,978,912
- Issue date Dec 18, 1990
- AG Communication Systems Corporation
- David L. Vonder
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus utilizing a hall effect device
- Patent number 4,417,205
- Issue date Nov 22, 1983
- GTE Automatic Electric Labs Inc.
- Robert J. Sabon
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable flux generator a magnetically activated electronic switch
- Patent number 4,322,709
- Issue date Mar 30, 1982
- GTE Automatic Electric Labs Inc.
- David L. Vonder
- G01 - MEASURING TESTING