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David L. Willenborg
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Dublin, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Sample characteristic analysis utilizing multi wavelength and multi...
Patent number
5,596,406
Issue date
Jan 21, 1997
Therma-Wave, Inc.
Allan Rosencwaig
G01 - MEASURING TESTING
Information
Patent Grant
Multiple angle spectroscopic analyzer utilizing interferometric and...
Patent number
5,412,473
Issue date
May 2, 1995
Therma-Wave, Inc.
Allan Rosencwaig
G01 - MEASURING TESTING
Information
Patent Grant
Optical measurement device with enhanced sensitivity
Patent number
5,159,412
Issue date
Oct 27, 1992
Therma-Wave, Inc.
David L. Willenborg
G01 - MEASURING TESTING
Information
Patent Grant
High resolution ellipsometric apparatus
Patent number
5,042,951
Issue date
Aug 27, 1991
Therma-Wave, Inc.
Nathan Gold
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for measuring thickness of thin films
Patent number
4,999,014
Issue date
Mar 12, 1991
Therma-Wave, Inc.
Nathan Gold
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for locating and testing areas of interest on a workpiece
Patent number
4,795,260
Issue date
Jan 3, 1989
Therma-Wave, Inc.
John Schuur
G01 - MEASURING TESTING
Information
Patent Grant
Detecting thermal waves to evaluate thermal parameters
Patent number
4,579,463
Issue date
Apr 1, 1986
Therma-Wave Partners
Allan Rosencwaig
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
High-sensitivity surface detection system and method
Publication number
20070229833
Publication date
Oct 4, 2007
Allan Rosencwaig
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for handling a substrate
Publication number
20060120832
Publication date
Jun 8, 2006
Rajeshwar Chhibber
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for illuminating a substrate during inspection
Publication number
20050146719
Publication date
Jul 7, 2005
Rajeshwar Chhibber
G01 - MEASURING TESTING
Information
Patent Application
High dynamic range optical inspection system and method
Publication number
20040207836
Publication date
Oct 21, 2004
Rajeshwar Chhibber
G01 - MEASURING TESTING