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David Lansing Dill
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Redwood City, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for automatically searching for functional defects in a desc...
Patent number
7,478,028
Issue date
Jan 13, 2009
Chian-Min Richard Ho
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically generating checkers for finding functional...
Patent number
7,007,249
Issue date
Feb 28, 2006
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for automatically searching for functional defects in a desc...
Patent number
6,885,983
Issue date
Apr 26, 2005
Mentor Graphics Corporation
Chian-Min Richard Ho
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically generating checkers for finding functional...
Patent number
6,609,229
Issue date
Aug 19, 2003
O-In Design Automation, Inc.
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for automatically searching for functional defects in a desc...
Patent number
6,292,765
Issue date
Sep 18, 2001
O-IN Design Automation
Chian-Min Richard Ho
G01 - MEASURING TESTING
Information
Patent Grant
Method for automatically generating checkers for finding functional...
Patent number
6,175,946
Issue date
Jan 16, 2001
O-IN Design Automation
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Method for automatically searching for functional defects in a desc...
Publication number
20050131665
Publication date
Jun 16, 2005
Chian-Min Richard Ho
G01 - MEASURING TESTING
Information
Patent Application
Method for automatically generating checkers for finding functional...
Publication number
20030200515
Publication date
Oct 23, 2003
0-In Design automation Inc.
Tai An Ly
G06 - COMPUTING CALCULATING COUNTING