David Lewis Adler

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for detecting defects in devices using X-rays
- Patent number 11,688,067
- Issue date Jun 27, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,662,479
- Issue date May 30, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray photoemission system for 3-D laminography
- Patent number 11,619,596
- Issue date Apr 4, 2023
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and systems for product failure prediction based on X-ray i...
- Patent number 11,615,533
- Issue date Mar 28, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for process control based on X-ray inspection
- Patent number 11,430,118
- Issue date Aug 30, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Devices processed using x-rays
- Patent number 11,373,778
- Issue date Jun 28, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing a security configuration of a networked environment
- Patent number 11,368,488
- Issue date Jun 21, 2022
- Fortinet, Inc.
- Manuel Nedbal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
X-ray photoemission apparatus for inspection of integrated devices
- Patent number 11,307,152
- Issue date Apr 19, 2022
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Super-resolution x-ray imaging method and apparatus
- Patent number 11,055,821
- Issue date Jul 6, 2021
- SVXR, Inc.
- Edward R. Ratner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,042,981
- Issue date Jun 22, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Super-resolution X-ray imaging method and apparatus
- Patent number 10,692,184
- Issue date Jun 23, 2020
- SVXR, Inc.
- Edward R. Ratner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Devices processed using x-rays
- Patent number 10,559,396
- Issue date Feb 11, 2020
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High speed X-ray microscope
- Patent number 9,646,732
- Issue date May 9, 2017
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Devices processed using x-rays
- Patent number 9,607,724
- Issue date Mar 28, 2017
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Method and apparatus for inspecting a substrate
- Patent number 9,529,279
- Issue date Dec 27, 2016
- KLA-Tencor Corporation
- David Adler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
X-ray photoemission microscope for integrated devices
- Patent number 9,291,578
- Issue date Mar 22, 2016
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting a substrate
- Patent number 9,170,503
- Issue date Oct 27, 2015
- KLA-Tencor Corporation
- David Adler
- G01 - MEASURING TESTING
Information Patent Grant
X-ray source with an immersion lens
- Patent number 9,142,382
- Issue date Sep 22, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High speed x-ray inspection microscope
- Patent number 9,129,715
- Issue date Sep 8, 2015
- SVXR, Inc.
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray source with increased operating life
- Patent number 8,995,622
- Issue date Mar 31, 2015
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray source with selective beam repositioning
- Patent number 8,831,179
- Issue date Sep 9, 2014
- Carl Zeiss X-ray Microscopy, Inc.
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with an emitter operating in medium vacuum
- Patent number 8,729,470
- Issue date May 20, 2014
- DLA Instruments
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for determining a characteristic of a wafer
- Patent number 8,422,010
- Issue date Apr 16, 2013
- KLA-Tencor Technologies Corp.
- Michael D. Kirk
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a characteristic of a wafer
- Patent number 8,284,394
- Issue date Oct 9, 2012
- KLA-Tencor Technologies Corp.
- Michael D. Kirk
- G01 - MEASURING TESTING
Information Patent Grant
Confocal secondary electron imaging
- Patent number 8,110,799
- Issue date Feb 7, 2012
- KLA-Tencor Corporation
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Grant
Reflective electron patterning device and method of using same
- Patent number 7,816,655
- Issue date Oct 19, 2010
- KLA-Tencor Technologies Corporation
- Harald F. Hess
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Robust measurement of parameters
- Patent number 7,660,687
- Issue date Feb 9, 2010
- KLA-Tencor Corporation
- Indranil De
- G01 - MEASURING TESTING
Information Patent Grant
Multiple directional scans of test structures on semiconductor inte...
- Patent number 7,656,170
- Issue date Feb 2, 2010
- KLA-Tencor Technologies Corporation
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrical process monitoring using mirror-mode electron microscopy
- Patent number 7,514,681
- Issue date Apr 7, 2009
- KLA-Tencor Technologies Corporation
- Paul F. Marella
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS
- Publication number 20240077302
- Publication date Mar 7, 2024
- FemtoMetrix, Inc.
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECOND-HARMONIC GENERATION FOR CRITICAL DIMENSIONAL METROLOGY
- Publication number 20220364850
- Publication date Nov 17, 2022
- FemtoMetrix, Inc.
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHOTOEMISSION SYSTEM FOR 3-D LAMINOGRAPHY
- Publication number 20220236199
- Publication date Jul 28, 2022
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Super-Resolution X-Ray Imaging Method and Apparatus
- Publication number 20210295469
- Publication date Sep 23, 2021
- SVXR, Inc.
- Edward R. RATNER
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210279878
- Publication date Sep 9, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTIMIZING A SECURITY CONFIGURATION OF A NETWORKED ENVIRONMENT
- Publication number 20210126948
- Publication date Apr 29, 2021
- ShieldX Networks, Inc.
- Manuel Nedbal
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Methods and Systems for Defects Detection and Classification Using...
- Publication number 20210010953
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Manufacturing Printed Circuit Board based o...
- Publication number 20210014979
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Methods and Systems for Printed Circuit Board Design Based on Autom...
- Publication number 20210012054
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Product Failure Prediction based on X-ray I...
- Publication number 20210010954
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Detecting Defects in Devices Using X-rays
- Publication number 20210012499
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Process Control Based on X-ray Inspection
- Publication number 20210011177
- Publication date Jan 14, 2021
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS
- Publication number 20200279351
- Publication date Sep 3, 2020
- SVXR, Inc.
- Edward R. RATNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY PHOTOEMISSION APPARATUS FOR INSPECTION OF INTEGRATED DEVICES
- Publication number 20200090826
- Publication date Mar 19, 2020
- David L. Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS
- Publication number 20200013145
- Publication date Jan 9, 2020
- SVXR, Inc.
- Edward R. RATNER
- G01 - MEASURING TESTING
Information Patent Application
Devices Processed Using X-Rays
- Publication number 20170200524
- Publication date Jul 13, 2017
- SVXR, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE
- Publication number 20170074810
- Publication date Mar 16, 2017
- KLA-Tencor Corporation
- David L. ADLER
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED X-RAY MICROSCOPE
- Publication number 20160351283
- Publication date Dec 1, 2016
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
INTEGRATED DEVICES WITH PHOTOEMISSIVE STRUCTURES
- Publication number 20160203938
- Publication date Jul 14, 2016
- David Lewis Adler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
DEVICES PROCESSED USING X-RAYS
- Publication number 20150270023
- Publication date Sep 24, 2015
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
High speed x-ray inspection microscope
- Publication number 20140064445
- Publication date Mar 6, 2014
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Application
X-ray photoemission microscope for integrated devices
- Publication number 20140037052
- Publication date Feb 6, 2014
- David L. Adler
- G01 - MEASURING TESTING
Information Patent Application
Methods and Systems for Determining a Characteristic of a Wafer
- Publication number 20130035877
- Publication date Feb 7, 2013
- KLA-Tencor Technologies Corporation
- Michael D. Kirk
- G01 - MEASURING TESTING
Information Patent Application
X-ray source with selective beam repositioning
- Publication number 20120269324
- Publication date Oct 25, 2012
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-ray source with an immersion lens
- Publication number 20120269323
- Publication date Oct 25, 2012
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-ray source with increased operating life
- Publication number 20120269325
- Publication date Oct 25, 2012
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
X-ray source with high-temperature electron emitter
- Publication number 20120269326
- Publication date Oct 25, 2012
- David L. Adler
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Electron microscope with an emitter operating in medium vacuum
- Publication number 20100314540
- Publication date Dec 16, 2010
- David L. Adler
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...
- Publication number 20080246030
- Publication date Oct 9, 2008
- KLA-TENCOR
- Akella V.S. Satya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...
- Publication number 20080237487
- Publication date Oct 2, 2008
- KLA-TENCOR
- Gustavo A. Pinto
- H01 - BASIC ELECTRIC ELEMENTS

David Lewis Adler

Person

Patents Grantslast 30 patents

Methods and systems for detecting defects in devices using X-rays

Methods and systems for printed circuit board design based on autom...

Methods and systems for manufacturing printed circuit board based o...

X-ray photoemission system for 3-D laminography

Methods and systems for product failure prediction based on X-ray i...

Methods and systems for process control based on X-ray inspection

Devices processed using x-rays

Optimizing a security configuration of a networked environment

X-ray photoemission apparatus for inspection of integrated devices

Super-resolution x-ray imaging method and apparatus

Methods and systems for printed circuit board design based on autom...

Super-resolution X-ray imaging method and apparatus

Devices processed using x-rays

High speed X-ray microscope

Devices processed using x-rays

Method and apparatus for inspecting a substrate

X-ray photoemission microscope for integrated devices

Method and apparatus for inspecting a substrate

X-ray source with an immersion lens

High speed x-ray inspection microscope

X-ray source with increased operating life

X-ray source with selective beam repositioning

Electron microscope with an emitter operating in medium vacuum

Methods and systems for determining a characteristic of a wafer

Methods and systems for determining a characteristic of a wafer

Confocal secondary electron imaging

Reflective electron patterning device and method of using same

Robust measurement of parameters

Multiple directional scans of test structures on semiconductor inte...

Electrical process monitoring using mirror-mode electron microscopy

Patents Applicationslast 30 patents

DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS

SECOND-HARMONIC GENERATION FOR CRITICAL DIMENSIONAL METROLOGY

X-RAY PHOTOEMISSION SYSTEM FOR 3-D LAMINOGRAPHY

Super-Resolution X-Ray Imaging Method and Apparatus

Methods and Systems for Printed Circuit Board Design Based on Autom...

OPTIMIZING A SECURITY CONFIGURATION OF A NETWORKED ENVIRONMENT

Methods and Systems for Defects Detection and Classification Using...

Methods and Systems for Manufacturing Printed Circuit Board based o...

Methods and Systems for Printed Circuit Board Design Based on Autom...

Methods and Systems for Product Failure Prediction based on X-ray I...

Methods and Systems for Detecting Defects in Devices Using X-rays

Methods and Systems for Process Control Based on X-ray Inspection

SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS

X-RAY PHOTOEMISSION APPARATUS FOR INSPECTION OF INTEGRATED DEVICES

SUPER-RESOLUTION X-RAY IMAGING METHOD AND APPARATUS

Devices Processed Using X-Rays

METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE

HIGH SPEED X-RAY MICROSCOPE

INTEGRATED DEVICES WITH PHOTOEMISSIVE STRUCTURES

DEVICES PROCESSED USING X-RAYS

High speed x-ray inspection microscope

X-ray photoemission microscope for integrated devices

Methods and Systems for Determining a Characteristic of a Wafer

X-ray source with selective beam repositioning

X-ray source with an immersion lens

X-ray source with increased operating life

X-ray source with high-temperature electron emitter

Electron microscope with an emitter operating in medium vacuum

TEST STRUCTURES AND METHODS FOR INSPECTION OF SEMICONDUCTOR INTEGRA...

MULTIPLE DIRECTIONAL SCANS OF TEST STRUCTURES ON SEMICONDUCTOR INTE...