David M. Craig

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Hillsboro, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe pins with etched tips for electrical die test
- Patent number 11,340,258
- Issue date May 24, 2022
- Intel Corporation
- Joseph D. Stanford
- G01 - MEASURING TESTING
Information Patent Grant
Probe pins with etched tips for electrical die test
- Patent number 10,598,696
- Issue date Mar 24, 2020
- Intel Corporation
- Joseph D. Stanford
- G01 - MEASURING TESTING
Information Patent Grant
Etching for probe wire tips for microelectronic device test
- Patent number 9,977,054
- Issue date May 22, 2018
- Intel Corporation
- Todd P. Albertson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE PINS WITH ETCHED TIPS FOR ELECTRICAL DIE TEST
- Publication number 20200209280
- Publication date Jul 2, 2020
- Intel Corporation
- Joseph D. Stanford
- G01 - MEASURING TESTING
Information Patent Application
PROBE PINS WITH ETCHED TIPS FOR ELECTRICAL DIE TEST
- Publication number 20170276700
- Publication date Sep 28, 2017
- Joseph D. Stanford
- G01 - MEASURING TESTING
Information Patent Application
ETCHING FOR PROBE WIRE TIPS FOR MICROELECTRONIC DEVICE TEST
- Publication number 20160363613
- Publication date Dec 15, 2016
- Intel Corporation
- TODD P. ALBERTSON
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR AUTOMATED SORT PROBE ASSEMBLY AND REPAIR
- Publication number 20130269173
- Publication date Oct 17, 2013
- Todd P. Albertson
- G01 - MEASURING TESTING