David M. Heffelfinger

Person

  • Oakland, CA, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    System for high throughput analysis

    • Publication number 20030044967
    • Publication date Mar 6, 2003
    • David M. Heffelfinger
    • G01 - MEASURING TESTING
  • Information Patent Application

    Photon efficient scanner

    • Publication number 20030030850
    • Publication date Feb 13, 2003
    • David M. Heffelfinger
    • G01 - MEASURING TESTING