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David M. Heffelfinger
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Oakland, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Photon efficient scanner
Patent number
7,016,087
Issue date
Mar 21, 2006
Becton Dickinson and Company
David M. Heffelfinger
G01 - MEASURING TESTING
Information
Patent Grant
System for high throughput analysis
Patent number
6,750,457
Issue date
Jun 15, 2004
Becton Dickinson and Company
David M. Heffelfinger
G01 - MEASURING TESTING
Information
Patent Grant
Optical autofocus for use with microtiter plates
Patent number
6,441,894
Issue date
Aug 27, 2002
Biometric Imaging, Inc.
Bala S. Manian
G02 - OPTICS
Information
Patent Grant
Optical autofocus for use with microtiter plates
Patent number
6,130,745
Issue date
Oct 10, 2000
Biometric Imaging, Inc.
Bala S. Manian
G02 - OPTICS
Patents Applications
last 30 patents
Information
Patent Application
System for high throughput analysis
Publication number
20030044967
Publication date
Mar 6, 2003
David M. Heffelfinger
G01 - MEASURING TESTING
Information
Patent Application
Photon efficient scanner
Publication number
20030030850
Publication date
Feb 13, 2003
David M. Heffelfinger
G01 - MEASURING TESTING