Membership
Tour
Register
Log in
David M. Kramer
Follow
Person
Corte Madera, CA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Fast spin echo MRI method compatible with CPMG violation
Patent number
7,538,548
Issue date
May 26, 2009
Toshiba Medical Systems Corp.
Hector E. Avram
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for diffusion magnetic resonance imaging with...
Patent number
7,218,110
Issue date
May 15, 2007
Toshiba America MRI, Inc.
Weiguo Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Separation and identification of water and fat MR images at mid-fie...
Patent number
6,603,990
Issue date
Aug 5, 2003
Toshiba America MRI, Inc.
Weiguo Zhang
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for providing separate water-dominant and fat-...
Patent number
6,263,228
Issue date
Jul 17, 2001
Toshiba America, MRI, Inc.
Weiguo Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for providing separate fat and water MRI image...
Patent number
5,909,119
Issue date
Jun 1, 1999
Toshiba America MRI, Inc.
Weiguo Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Correction for field variation in steady-state MRI by repeated acqu...
Patent number
5,652,514
Issue date
Jul 29, 1997
Toshiba America MRI, Inc.
Weiguo Zhang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FAST SPIN ECHO MRI METHOD COMPATIBLE WITH CPMG VIOLATION
Publication number
20080009701
Publication date
Jan 10, 2008
Hector E. Avram
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for diffusion magnetic resonance imaging with...
Publication number
20070052417
Publication date
Mar 8, 2007
Toshiba America MRI, Inc.
Weiguo Zhang
G01 - MEASURING TESTING
Information
Patent Application
Separation and identification of water and fat MR images at mid-fie...
Publication number
20030060697
Publication date
Mar 27, 2003
Weiguo Zhang
G01 - MEASURING TESTING
Information
Patent Application
MAGNETIC RESONANCE IMAGING COMPENSATED FOR VERY RAPID VARIATIONS IN...
Publication number
20010054898
Publication date
Dec 27, 2001
ANDREW LI
G01 - MEASURING TESTING