David M. Owen

Person

Redondo Beach, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of characterizing semiconductor light-emitting devices base...
- Patent number 8,765,493
- Issue date Jul 1, 2014
- Ultratech, Inc.
- Andrew M. Hawryluk
- G01 - MEASURING TESTING
Information Patent Grant
Determination of lithography misalignment based on curvature and st...
- Patent number 7,433,051
- Issue date Oct 7, 2008
- Ultratech, Inc.
- David Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Full-field optical measurements of surface properties of panels, su...
- Patent number 7,369,251
- Issue date May 6, 2008
- Ultratech, Inc.
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Grant
Coherent gradient sensing ellipsometer
- Patent number 6,469,788
- Issue date Oct 22, 2002
- California Institute of Technology
- David A. Boyd
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Full-wafer inspection methods having selectable pixel density
- Publication number 20170178980
- Publication date Jun 22, 2017
- Ultratech, Inc.
- David M. Owen
- G01 - MEASURING TESTING
Information Patent Application
Systems and methods of characterizing process-induced wafer shape f...
- Publication number 20170162456
- Publication date Jun 8, 2017
- Ultratech, Inc.
- David M. Owen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF CHARACTERIZING SEMICONDUCTOR LIGHT-EMITTING DEVICES BASE...
- Publication number 20140141538
- Publication date May 22, 2014
- ULTRATECH, INC.
- Andrew M. Hawryluk
- G01 - MEASURING TESTING
Information Patent Application
Determination of lithography misalignment based on curvature and st...
- Publication number 20070212856
- Publication date Sep 13, 2007
- David Owen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Optical characterization of surfaces and plates
- Publication number 20050007601
- Publication date Jan 13, 2005
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Application
Full-field optical measurements of surface properties of panels, su...
- Publication number 20040257587
- Publication date Dec 23, 2004
- Ares J. Rosakis
- G01 - MEASURING TESTING
Information Patent Application
Coherent gradient sensing ellipsometer
- Publication number 20020012122
- Publication date Jan 31, 2002
- David A. Boyd
- G01 - MEASURING TESTING

David M. Owen

Person

Patents Grantslast 30 patents

Methods of characterizing semiconductor light-emitting devices base...

Determination of lithography misalignment based on curvature and st...

Full-field optical measurements of surface properties of panels, su...

Coherent gradient sensing ellipsometer

Patents Applicationslast 30 patents

Full-wafer inspection methods having selectable pixel density

Systems and methods of characterizing process-induced wafer shape f...

METHODS OF CHARACTERIZING SEMICONDUCTOR LIGHT-EMITTING DEVICES BASE...

Determination of lithography misalignment based on curvature and st...

Optical characterization of surfaces and plates

Full-field optical measurements of surface properties of panels, su...

Coherent gradient sensing ellipsometer