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David M. Shuttleworth
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Orlando, FL, US
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last 30 patents
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Patent Grant
Defect identification system and method for repairing killer defect...
Patent number
7,547,560
Issue date
Jun 16, 2009
Agere Systems Inc.
Oliver Desmond Patterson
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Defect identification system and method for repairing killer defect...
Publication number
20070010032
Publication date
Jan 11, 2007
Oliver Desmond Patterson
G01 - MEASURING TESTING
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Patent Application
Defect identification system and method for repairing killer defect...
Publication number
20050255611
Publication date
Nov 17, 2005
Oliver Desmond Patterson
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor device contamination reduction in a fluorinated oxide...
Publication number
20050191863
Publication date
Sep 1, 2005
Leonard Jay Olmer
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...