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David M. Wu
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Melbourne, FL, US
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic device and method of biasing
Patent number
8,687,417
Issue date
Apr 1, 2014
GlobalFoundries Inc.
Ruigang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charging protection device
Patent number
8,546,855
Issue date
Oct 1, 2013
Globalfoundres Inc.
Jingrong Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods for fabricating a semiconductor device having decreased con...
Patent number
8,329,519
Issue date
Dec 11, 2012
GLOBALFOUNDRIES, INC.
Zhonghai Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scan architecture and design methodology yielding significant reduc...
Patent number
8,321,730
Issue date
Nov 27, 2012
Intel Corporation
Talal K. Jaber
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor device having decreased contact resistance
Patent number
8,134,208
Issue date
Mar 13, 2012
GLOBALFOUNDRIES Inc.
Zhonghai Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Computer-implemented method, apparatus, and computer program produc...
Patent number
8,112,763
Issue date
Feb 7, 2012
International Business Machines Corporation
Suhong Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Integrated circuit system with triode
Patent number
8,089,125
Issue date
Jan 3, 2012
Advanced Micro Devices, Inc.
Jianhong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor device with transistor-based fuses and related progra...
Patent number
8,050,077
Issue date
Nov 1, 2011
Advanced Micro Devices, Inc.
Ruigang Li
G11 - INFORMATION STORAGE
Information
Patent Grant
Charging protection device
Patent number
8,048,753
Issue date
Nov 1, 2011
GLOBALFOUNDRIES Inc.
Jingrong Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming multiple fins for a semiconductor device
Patent number
8,003,466
Issue date
Aug 23, 2011
Advanced Micro Devices, Inc.
Zhonghai Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOS structures with remote contacts and methods for fabricating the...
Patent number
7,989,891
Issue date
Aug 2, 2011
GLOBALFOUNDRIES Inc.
Jianhong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for fabricating a semiconductor device having an extended st...
Patent number
7,761,838
Issue date
Jul 20, 2010
GLOBALFOUNDRIES Inc.
Zhonghai Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Common test logic for multiple operation modes
Patent number
7,734,972
Issue date
Jun 8, 2010
Intel Corporation
Talal Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
SOI device with charging protection and methods of making same
Patent number
7,727,835
Issue date
Jun 1, 2010
Advanced Micro Devices, Inc.
David D. Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
MOS structures with contact projections for lower contact resistanc...
Patent number
7,670,932
Issue date
Mar 2, 2010
Advanced Micro Devices, Inc.
Jianhong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of forming contact openings
Patent number
7,670,938
Issue date
Mar 2, 2010
GLOBALFOUNDRIES, INC.
David D. Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Stress enhanced semiconductor device and methods for fabricating same
Patent number
7,638,837
Issue date
Dec 29, 2009
GlobalFoundries Inc.
Akif Sultan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming transistor devices with different threshold volta...
Patent number
7,598,161
Issue date
Oct 6, 2009
Advanced Micro Devices, Inc.
Jingrong Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Distinguishing between dopant and line width variation components
Patent number
7,582,493
Issue date
Sep 1, 2009
Advanced Micro Devices, Inc.
Akif Sultan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System for characterization of low-k dielectric material damage
Patent number
7,576,357
Issue date
Aug 18, 2009
Advanced Micro Devices, Inc.
Jianhong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods of quantifying variations resulting from manufacturing-indu...
Patent number
7,504,270
Issue date
Mar 17, 2009
Advanced Micro Devices, Inc.
David D. Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for reducing floating body effects in SOI semiconductor devi...
Patent number
7,482,252
Issue date
Jan 27, 2009
Advanced Micro Devices, Inc.
David Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
SOI Device with charging protection and methods of making same
Patent number
7,414,289
Issue date
Aug 19, 2008
Advanced Micro Devices, Inc.
David D. Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for testing a memory array
Patent number
7,370,249
Issue date
May 6, 2008
Intel Corporation
Zhuoyu Bao
G11 - INFORMATION STORAGE
Information
Patent Grant
Test structure for measuring electrical and dimensional characteris...
Patent number
7,355,201
Issue date
Apr 8, 2008
Advanced Micro Devices, Inc.
Jianhong Zhu
G01 - MEASURING TESTING
Information
Patent Grant
Test structure and method for measuring the resistance of line-end...
Patent number
7,271,047
Issue date
Sep 18, 2007
Advanced Micro Devices, Inc.
Jianhong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Selective P-channel VT adjustment in SiGe system for leakage optimi...
Patent number
7,253,045
Issue date
Aug 7, 2007
Advanced Micro Devices, Inc.
Derick J. Wristers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Flexible scan architecture
Patent number
7,216,274
Issue date
May 8, 2007
Intel Corporation
Talal K. Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Bi-modal halo implantation
Patent number
7,176,095
Issue date
Feb 13, 2007
Advanced Micro Devices, Inc.
Akif Sultan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of forming a gate electrode on a semiconductor device and a...
Patent number
7,087,509
Issue date
Aug 8, 2006
Advanced Micro Devices, Inc.
William R. Roche
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PHASED ARRAY FREQUENCY MODULATED CONTINUOUS WAVE RADAR WITH NON-UN...
Publication number
20230176184
Publication date
Jun 8, 2023
Zadar Labs, Inc.
Mohammad EMADI
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING DECREASED CONTACT RESISTANCE
Publication number
20120070987
Publication date
Mar 22, 2012
GLOBALFOUNDRIES INC.
Zhonghai SHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGING PROTECTION DEVICE
Publication number
20120007182
Publication date
Jan 12, 2012
GLOBALFOUNDRIES INC.
Jingrong Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SCAN ARCHITECTURE AND DESIGN METHODOLOGY YIELDING SIGNIFICANT REDUC...
Publication number
20110161759
Publication date
Jun 30, 2011
Talal K. Jaber
G01 - MEASURING TESTING
Information
Patent Application
CHARGING PROTECTION DEVICE
Publication number
20100314685
Publication date
Dec 16, 2010
GLOBALFOUNDRIES INC.
Jingrong Zhou
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE WITH TRANSISTOR-BASED FUSES AND RELATED PROGRA...
Publication number
20100214008
Publication date
Aug 26, 2010
Advanced Micro Devices, Inc.
Ruigang LI
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF FORMING MULTIPLE FINS FOR A SEMICONDUCTOR DEVICE
Publication number
20090253238
Publication date
Oct 8, 2009
Advanced Micro Devices, Inc.
Zhonghai SHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Common test logic for multiple operation modes
Publication number
20090187799
Publication date
Jul 23, 2009
Talal Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRONIC DEVICE AND METHOD OF BIASING
Publication number
20090090969
Publication date
Apr 9, 2009
Advanced Micro Devices, Inc.
Ruigang Li
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR DEVICE HAVING DECREASED CONTACT RESISTANCE
Publication number
20090078998
Publication date
Mar 26, 2009
Advanced Micro Devices, Inc.
Zhongai Shi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE HAVING AN EXTENDED ST...
Publication number
20090081837
Publication date
Mar 26, 2009
Advanced Micro Devices, Inc.
Zhonghai SHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD OF FORMING TRANSISTOR DEVICES WITH DIFFERENT THRESHOLD VOLTA...
Publication number
20090081860
Publication date
Mar 26, 2009
Advanced Micro Devices, Inc.
Jingrong ZHOU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STRESS ENHANCED SEMICONDUCTOR DEVICE AND METHODS FOR FABRICATING SAME
Publication number
20090078991
Publication date
Mar 26, 2009
Advanced Micro Devices, Inc.
Akif SULTAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOI DEVICE WITH CHARGING PROTECTION AND METHODS OF MAKING SAME
Publication number
20080318369
Publication date
Dec 25, 2008
Advanced Micro Devices, Inc.
DAVID D. WU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MOS STRUCTURES WITH CONTACT PROJECTIONS FOR LOWER CONTACT RESISTANC...
Publication number
20080308879
Publication date
Dec 18, 2008
Advanced Micro Devices, Inc.
Jianhong ZHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INTEGRATED CIRCUIT SYSTEM WITH TRIODE
Publication number
20080303089
Publication date
Dec 11, 2008
Advanced Micro Devices, Inc.
Jianhong Zhu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MOS STRUCTURES WITH REMOTE CONTACTS AND METHODS FOR FABRICATING THE...
Publication number
20080296682
Publication date
Dec 4, 2008
Advanced Micro Devices, Inc.
Jianhong ZHU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Distinguishing Between Dopant and Line Width Variation Components
Publication number
20080085570
Publication date
Apr 10, 2008
Akif Sultan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOI DEVICE WITH CHARGING PROTECTION AND METHODS OF MAKING SAME
Publication number
20080012072
Publication date
Jan 17, 2008
David D. Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TEST STRUCTURE FOR MEASURING ELECTRICAL AND DIMENSIONAL CHARACTERIS...
Publication number
20070296444
Publication date
Dec 27, 2007
Jianhong Zhu
G01 - MEASURING TESTING
Information
Patent Application
METHODS OF QUANTIFYING VARIATIONS RESULTING FROM MANUFACTURING-INDU...
Publication number
20070298524
Publication date
Dec 27, 2007
DAVID D. WU
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHODS OF FORMING CONTACT OPENINGS
Publication number
20070259513
Publication date
Nov 8, 2007
David D. Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Flexible scan architecture
Publication number
20070168767
Publication date
Jul 19, 2007
Talal K. Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Computer-implemented method, apparatus, and computer program produc...
Publication number
20070124741
Publication date
May 31, 2007
International Business Machines Corporation
Suhong Ma
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus for testing a memory array
Publication number
20050283688
Publication date
Dec 22, 2005
Zhuoyu Bao
G11 - INFORMATION STORAGE
Information
Patent Application
Flexible scan architecture
Publication number
20040267504
Publication date
Dec 30, 2004
Talal K. Jaber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Composite spacer liner for improved transistor performance
Publication number
20040259343
Publication date
Dec 23, 2004
Advanced Micro Devices, Inc.
James F. Buller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of forming resistive structures
Publication number
20040235258
Publication date
Nov 25, 2004
David Donggang Wu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Scan cell systems and methods
Publication number
20040119501
Publication date
Jun 24, 2004
Anil K. Sabbavarapu
G01 - MEASURING TESTING
Information
Patent Application
SOI mosfet junction degradation using multiple buried amorphous layers
Publication number
20030162336
Publication date
Aug 28, 2003
Advanced Micro Devices, Inc.
Andy Wei
H01 - BASIC ELECTRIC ELEMENTS